Carbon Steel
Pipes and Plates
Olympus’ versatile solution for weld inspections uses a variety of techniques to achieve a productive and efficient inspection on plates and pipes from 4.5 in. OD and up. Phased array, time of flight diffraction, and conventional ultrasonic techniques can be used alone or in combination to achieve full-weld coverage with high probability of detection.
This solution also includes different scanning methods for accurate defect position and sizing. The stability and encoding capability offered by scanners results in better data quality as well as enables code compliant inspections. Scanning is done using different scanners for manual, manual-encoded, semiautomated or automated data collection method.
The Olympus carbon steel weld inspection solution brings together Olympus acquisition units, scanners, probes, and software tailored to your needs. The solutions allow length and depth sizing for code acceptance /rejection.
Compound Scan
|
A single-group compound scan offers similar coverage as two sectorial scans
Olympus’ updated NDT SetupBuilder software now offers the capability to perform compound scan beams. This innovative inspection strategy consists of a mix between sectorial and linear beams and offers many advantages such as:
|
Weld Series PA Probes and Wedges
 |
The A31 and A32 phased array probes and wedges offer unique features for a new level of performance.
|
High Temperature Inspection
 |
A high-temperature wedge option compatible with the new A31 and A32 phased array probes and Olympus Mini-Wheel encoder is available upon request. The option enables the inspection of parts with a surface temperature up to 150 ⁰C. |
Passive-Axis Focusing (PAF) Wedges
 |
Olympus’ patented passive-axis focusing wedge series helps compensate for beam divergence in the passive direction for pipe girth weld inspection. The smaller beam width enables the sizing of shorter flaws on the scan axis, helping lower rejection rates. Also, because the beam energy is focused, the signal-to-noise ratio (SNR) is improved, leading to sharper images of the defects. |
